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FMRA-2008
Ferro-Magnetic Resonance Module

The FMRA-2008 Module accurately measures magnetic resonance at RF frequencies up to 20Ghz, ideal for characterizing the RF magnetic performance of Magneto-Resistive sensors in multi-directional magnetic fields.

Key Benefits

  • RF Probecard and connection with measurement range up to 20Ghz

  • Compatible with our standard test suite

  • Low Noise measurement system

  • Comprehensive MR Analysis 

  • Open architecture software allowing custom module design

  • Available with either ISI's WLA5000 Wafer or BlazerX6B Bar Analyzer platforms

  • Fully integrated with our software, power supplies, and test platform

Overview

ISI's proprietary FMRA-2008 Module accurately measures magnetic resonance at RF frequencies up to 20Ghz, ideal for characterizing the RF magnetic performance of Magneto-Resistive sensors in multi-directional magnetic fields. Characterizing the MR sensor using Ferro Magnetic Resonance techniques can not only examine the sensor performance, but, often, pinpoint a particular problem in the design or manufacturing process, such as concerns with the Hard-Bias or the Reference/Pinning Layer. 

 

The FMRA-2008 electronics module is intended for use with QuadPole magnet systems on either the WLA5000 Wafer Analyzer or the BlazerX6B Bar Analyzer, and incorporates RF Probing and multi-directional field vectors to allow the extensive suite of FMRA-2008 measurements. These measurements include:

  • Ferro Magnetic Resonance Spectrum Analysis

  • Diagnostics of hard bias level and uniformity

  • Stiffness field measurement 

  • Reference layer/Pinning layer diagnostics

  • Free layer uniformity and domains detection

  • Free layer magnetization orientation

  • High Bandwidth Noise Analysis

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As MR sensor dimensions shrink in the race to higher Arial Density, control of the reader sensor dimensions becomes more difficult causing many of the above issues. The FMRA-2008 is world's first low-cost, non-destructive, in-situ solution to characterize these issues in a manufacturing environment with production-level throughput. 

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