tester uses same field proven technology as
for measurements and an innovative mechanical platform that make it the
most advanced Row/Bar level QST Lifecycle Tester.
can test two bars simultaneously with up to 96 write/read stress channels
at elevated temperature. The mode of operation is to apply V/I Bias stress
to the MR sensor (optional Write stress to Writer) at elevated temperature
for an extended period of time, then perform standard QST and AC Channel
measurements as metrics of performance degradation.
tester uses the same core measurement capabilities as the
with Gen3 Front-end Electronics.
QST-2002-RT can stress and test in-situ up to 12 HGA's at various
user-defined temperatures and is designed to be part of a large HGA sample
population testing for HGA life prediction. The mode of operation is to apply
V/I Bias stress to the MR sensor (or additionally any combination of Bias
stress, Write stress, Magnetic Field Stress, DFH Stress, and Bias Pulsing
stress) at elevated temperatures for an extended period of time, then perform
standard QST and AC Channel measurements as metrics of performance degradation.
- ESD Stress System
The ISI EPS-100 (ESD/CDM Pulse System), designed specifically for ESD
sensitive devices such as (G)MR heads, allows the user to stress these devices with controlled ESD
waveforms. When used with ISI QST-2002 systems, magnetic performance of the (G)MR head
versus ESD stress can be characterized.