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BLAZER-X5L
QST-2002-RT
ESD

 
BLAZER-X5L
 
The BLAZER-X5L tester uses same field proven technology as QST-2002 for measurements and an innovative mechanical platform that make it the most advanced Row/Bar level QST Lifecycle Tester.

The
BLAZER-X5L can test two bars simultaneously with up to 96 write/read stress channels at elevated temperature. The mode of operation is to apply V/I Bias stress to the MR sensor (optional Write stress to Writer) at elevated temperature for an extended period of time, then perform standard QST and AC Channel measurements as metrics of performance degradation.
 
QST-2002-RT
 
The QST-2002-RT tester uses the same core measurement capabilities as the QST-2002/QST-2002E with Gen3 Front-end Electronics.

The
QST-2002-RT can stress and test in-situ up to 12 HGA's at various user-defined temperatures and is designed to be part of a large HGA sample population testing for HGA life prediction. The mode of operation is to apply V/I Bias stress to the MR sensor (or additionally any combination of Bias stress, Write stress, Magnetic Field Stress, DFH Stress, and Bias Pulsing stress) at elevated temperatures for an extended period of time, then perform standard QST and AC Channel measurements as metrics of performance degradation.
 
ESD Stress System  
 
The ISI EPS-100 (ESD/CDM Pulse System), designed specifically for ESD sensitive devices such as (G)MR heads, allows the user to stress these devices with controlled ESD waveforms. When used with ISI QST-2002 systems, magnetic performance of the (G)MR head versus ESD stress can be characterized.
 

 

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Last modified: September 21, 2011