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 Providing Innovative Solutions For The Magnetic Recording Industry



The BLAZER-X5L tester uses same field proven technology as QST-2002 for measurements and an innovative mechanical platform that make it the most advanced Row/Bar level QST Lifecycle Tester.

BLAZER-X5L can test two bars simultaneously with up to 96 write/read stress channels at elevated temperature. The mode of operation is to apply V/I Bias stress to the MR sensor (optional Write stress to Writer) at elevated temperature for an extended period of time, then perform standard QST and AC Channel measurements as metrics of performance degradation.

Performance metric measurements include high speed Transfer Curve and Resistance analysis, and the most advanced instability detection system of any QST Tester available today. These measurement, performed through our unique AC channel with integrated digital scope, include Popcorn, AC Noise, Maximum Amplitude Noise (MAN) and Spectral Maximum Amplitude Noise (SMAN).

BLAZER-X5Ls unique configuration separates the stress station from the QST measurement station. Also unique electronics allow user to quickly switch between Up/Down bars without re-aligning the probe cards.

The tester comes equipped standard with one Vision System for Probe Card Alignment.

Key Benefits

  • Pad miss-contact detection
  • Four point resistance measurement
  • Up/Down slider selection with single Probe Card
  • Writer resistance measurement
  • Contacts grounded during probing
  • Supports Pico and Femto type sliders Compact footprint
  • Probe contacts both writer and reader
  • Simple Probe Card Alignment
  • Position limit sensors
  • Position verification encoders
  • Up to 96 parallel Write/Read stress channels
  • Simulteneous Write, Bias and Temperature stress
  • Simulteneous Write stress of up to 16 channels
  • Independent Bias control for all 96 ch
  • True V/I Bias modes
  • Writer and MR resistance mea surements
  • Probe contact verification
  • Up to 150 C, both bars simultaneous
  • Closed loop temp control

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Last modified: September 21, 2011