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QST-2002
 
QST-2002 Quasi-Static tester can quickly and accurately characterize (G)MR heads performance in Manufacturing, R&D, and Failure Analysis. With such options as HGA, HSA, HDA, and Tape Head tooling, Temperature Stress (Electromigration) of up to 8 heads at a time, and ESD stress the user can customize the system for their specific needs or utilize a complete (G)MR test system.
RIA-2008
 
The RIA-2008 is the world's first Static Writer Analyzer that characterizes the magnetic performance of the head's inductive writer by analyzing relative inductance while applying combination of various I-Bias and multi-directional magnetic fields. The measured magnetic performance of the writer shows strong correlation to its performance in the drive.
 
QST-2002HF
 
QST-2002HF Quasi-Static tester can characterize (G)MR heads performance in R&D, and Failure Analysis applications at extremely high magnetic fields.
 
QST-2002-RT
 
The QST-2002-RT tester uses the same core measurement capabilities as the QST-2002/QST-2002E with Gen3 Front-end Electronics.

The
QST-2002-RT can stress and test in-situ up to 12 HGA's at various user-defined temperatures and is designed to be part of a large HGA sample population testing for HGA life prediction. The mode of operation is to apply V/I Bias stress to the MR sensor (or additionally any combination of Bias stress, Write stress, Magnetic Field Stress, DFH Stress, and Bias Pulsing stress) at elevated temperatures for an extended period of time, then perform standard QST and AC Channel measurements as metrics of performance degradation.
Toolings
 

HGA/HSA/HDA toolings allow the user to perform HGA,HSA and HDA level QST testing.  Custom toolings have been developed for a variety of customer applications.

 

2x HGA tooling allows the user to perform high throughput HGA level QST testing, by testing 2 MR HGAs simultaneously.

 

Tape Head Tooling allows the user to perform QST testing on Tape Heads, with up to 32 independent channels.

 
Options

        Available bolt-on options for QST-2002

 

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Last modified: September 21, 2011